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MultiDyne Video & Fiber Optic Systems - OG-5410-2TSG
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3G/HD/SD-SDI Dual Test Signal Generator with Moving Box Active Signal Indication and Bi-level/Tri-level Sync Out Card

Model: OG-5410-2TSG

  • Comprehensive test signal generation for SDI/analog video and baseband discrete audio in an easily integrated openGear® card
  • Easy to use, intuitive, flexible, and far more economical than typical bench equipment
  • Fully-independent dual generator blocks offer simultaneous output of user-configured test packages, or instant user selection between generators via output crosspoint
  • Moving-box/motion insertion enable serves as an easy to use dynamic raster confidence check SDI import allows insertion of user static raster/patterns as an alternative addition to standard test pattern outputs
  • DID/SDID authoring allows custom payloads to be written to specific DID/SDID locations as test packets for downstream systems
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The MultiDyne OG-5410-2TSG 3G/HD/SD-SDI Dual Test Signal Generator with Moving Box Active Signal Indication and Bi-Level/Tri-Level Sync Out offers an easy to use, economical solution to providing comprehensive test signal packages to ensure validity of downstream baseband SDI systems. The OG-5410-2TSG is an unprecedented first in the high-density openGear® based card form factor. Two independent generator blocks can be set to offer dual test packages which can be simultaneoulsy outputted or selectively fed to a single downstream path via a 2x4 output crosspoint.

  • Comprehensive test signal generation for SDI/analog video and baseband discrete audio in an easily integrated openGear® card
  • Easy to use, intuitive, flexible, and far more economical than typical bench equipment
  • Fully-independent dual generator blocks offer simultaneous output of user-configured test packages, or instant user selection between generators via output crosspoint
  • Moving-box/motion insertion enable serves as an easy to use dynamic raster confidence check SDI import allows insertion of user static raster/patterns as an alternative addition to standard test pattern outputs
  • DID/SDID authoring allows custom payloads to be written to specific DID/SDID locations as test packets for downstream systems
  • Full suite of output interfaces – SDI, CVBS, AES and analog audio
  • Convenience RS-485 LTC output works with legacy systems and checks bi-phase LTC/SMPTE 12 correlation in mixed systems
  • Low-power/high-density design – less than 18 Watts per card
  • Remote control/monitoring via Dashboard™ software
 
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